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Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy
Remarks Applications Electron Spectroscopy
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2010/9/17
The quantification of results of electron spectroscopies, AES and XPS, requires knowledge of the inelastic mean free path (IMFP) of signal electrons in solids. This parameter determines the surface s...
Electron Spectroscopy for Material Characterization
Electron Spectroscopy Material Characterization
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2010/6/30
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characteriz...