搜索结果: 1-15 共查到“工学 metrology”相关记录37条 . 查询时间(0.187 秒)
2018年SPIE陡峭色散工程与光原子精密测量会议（SPIE Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI）
2018年 SPIE 陡峭色散工程 光原子 精密测量 会议
font style='font-size:12px;'>
2017/11/28
2018年SPIE陡峭色散工程与光原子精密测量会议（SPIE Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI）。
2018年SPIE光学制造，测试和计量会议（SPIE Optical Fabrication,Testing,and Metrology VI）
2018年 SPIE 光学制造，测试和计量 会议
font style='font-size:12px;'>
2017/10/27
Today’s optical fabrication technologies are facing ever-increasing demands from industry and research. This is driven by tough requirements for cost and time reduction in production and R&D as well a...
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）
2018年 SPIE 微光刻的计量，检验和过程控制 会议
font style='font-size:12px;'>
2017/10/27
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）。
2018年SPIE三维光学计量检验实际应用会议（SPIE Dimensional Optical Metrology and Inspection for Practical Applications VII）
2018年 SPIE 三维光学计量检验实际应用 会议
font style='font-size:12px;'>
2017/10/27
This conference will focus on methods, analysis, and applications of optical metrology and inspection as applied to various industries, with particular emphasis on practical applications for non-optic...
2017年第一届国际计量会议（2017 1st International Conference on Metrology）
2017年 第一届 国际计量 会议
font style='font-size:12px;'>
2017/10/24
The International Conference on Metrology (abbreviated ICONMET) is a biennial scientific meeting on metrology organized by RCM – LIPI (Research Center for Metrology – Indonesia Institute of Science (L...
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIEX 射线和EUV光学计量学进展 专题会议
font style='font-size:12px;'>
2017/4/25
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）。
2017 SPIE 光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）
2017 SPIE 光学计量 建模 会议
font style='font-size:12px;'>
2017/4/25
Conference Sessions 1: Light Scattering 2: Optical Systems 3: Mueller Polarimetry 4: Interferometry and Phase I 5: Interferometry and Phase II .
2017 SPIE 应用光学计量专题会议（Applied Optical Metrology II）
2017 SPIE 应用光学计量 专题会议
font style='font-size:12px;'>
2017/4/25
Conference Sessions:1: 3D Shape Measurement ;2: Polarization Measurement and Techniques ;3: Fine Scale Feature Metrology Optical Engineering Plenary Session Optomechanical/Instrument Technical Group E...
2017 SPIE X射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIE X射线 EUV光学计量学进展 专题会议
font style='font-size:12px;'>
2017/4/25
Conference Sessions:1: At-Wavelength Metrology ;2: Metrology of VLS Gratings Technology Hot Topics: How Optics and Photonics Drive Innovation ;3: Calibration and Nanoradian Metrology ;4: Metrology Fac...
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）
2017 SPIE 光学计量建模 会议
font style='font-size:12px;'>
2017/4/25
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）。
2017SPIE光学计量会议（SPIE Optical Metrology 2017）
2017 SPIE 光学计量 会议
font style='font-size:12px;'>
2017/4/25
Take this opportunity to share your research at SPIE Optical Metrology 2017. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical...
2017第10届慢光，快光和光电原子精密计量研讨会（Slow Light,Fast Light,and Opto-Atomic Precision Metrology X）
2017 第10届 慢光，快光和光电原子精密计量 研讨会
font style='font-size:12px;'>
2017/1/12
OPTO is organized into eight tracks. Choose a track and click to see the list of conferences.Review conference details by clicking on the titles below. These details include paper titles, authors, sch...
OBSERVATIONS ON THE PERFORMANCE OF X-RAY COMPUTED TOMOGRAPHY FOR DIMENSIONAL METROLOGY
X-ray computed tomography (XCT) dimensional metrology holeplate orientation beam hardening
font style='font-size:12px;'>
2016/11/11
X-ray computed tomography (XCT) is a rising technology within many industries and sectors with a demand for dimensional metrology, defect, void analysis and reverse engineering. There are many variabl...
INDUSTRIAL PHOTOGRAMMETRY - ACCEPTED METROLOGY TOOL OR EXOTIC NICHE
Industrial photogrammetry close range mobile industrial application 3D point measurement optical CMM
font style='font-size:12px;'>
2016/11/11
New production technologies like 3D printing and other adaptive manufacturing technologies have changed the industrial manufacturing process, often referred to as next industrial revolution or short i...
APPLICATION OF VISION METROLOGY TO IN-ORBIT MEASUREMENT OF LARGE REFLECTOR ONBOARD COMMUNICATION SATELLITE FOR NEXT GENERATION MOBILE SATELLITE COMMUNICATION
Vision Metrology in Orbit Communication Satellite Large Deployable Antenna
font style='font-size:12px;'>
2016/11/11
Satellite for next generation mobile satellite communication service with small personal terminal requires onboard antenna with very large aperture reflector larger than twenty meters diameter because...