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搜索结果: 1-8 共查到Deformation measurement相关记录8条 . 查询时间(0.109 秒)
During last few years the use of Terrestrial Laser Scanner has increased notably in different application fields, like architecture, geology and geodesy. The paper focuses in the use of TLS data for ...
Terrestrial laserscanning broadens its application area in the civil engineering industry. This paper discusses the potential of the technology through the example of the deformation measurement of a...
Terrestrial laserscanning broadens its application area in the civil engineering industry. This paper discusses the potential of the technology through the example of the deformation measurement of a...
Modelling Point Clouds for Precise Structural Deformation measurement     Laser scanning  Metrology  Modelling       font style='font-size:12px;'> 2015/7/15
Terrestrial laser scanners can rapidly acquire thousands of 3D points over a structure. The individual scan points are of relatively low precision (±2mm – ±50mm) depending on the instrument type. How...
DEFORMATION MEASUREMENT USING INTERFEROMETRIC SAR DATA     Remote Sensing  Monitoring  Detection  Modelling  Decision Support       font style='font-size:12px;'> 2015/6/1
The paper focuses on the differential interferometric SAR (Synthetic Aperture Radar) technique for the monitoring of terrain surface deformations. The paper begins with a concise description of the pr...
UNDERGROUND DEFORMATION MEASUREMENT USING NEW QUARTZ INSTRUMENTS     tiltmeter  extensometer  deformation  tilt  compression       font style='font-size:12px;'> 2015/3/13
UNDERGROUND DEFORMATION MEASUREMENT USING NEW QUARTZ INSTRUMENTS.
Interferometric SAR (InSAR), which is an application technique of synthetic aperture radar, is becoming established as the method for monitoring of ground displacement that can observe subtle surface ...
Deformation measurement of RF MEMS switches by optical interference           font style='font-size:12px;'> 2007/7/28
期刊信息 篇名 Deformation measurement of RF MEMS switches by optical interference 语种 英文 撰写或编译 撰写 作者 Yu Ying,Peter Grant 第一作者单位 刊物名称 Microelectronics Reliability 页面 Vol.44, pp951-955 出版日期 2004年 月 日 文章标识(ISSN...

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