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MIT.nano receives grant to acquire focused ion beam scanning electron microscope（图）
聚焦离子束 扫描电子显微镜 双束纳米制造平台
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2023/6/9
The VELION FIB-SEM, a next-generation dual-beam nanofabrication platform located in MIT.nano, will become a permanent part of the facility’s characterization capabilities, thanks in part to a Major Re...