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Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL
electro-optical sampling measurement of electron beam bunch length non-synchronous delay scanning technique
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2010/5/7
The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling meas...
Preliminary result of bunch length measurement using a modified Michelson interferometer
femtosecond linear accelerator bunch length interferometer hollow retroreflector
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2009/9/17
Based on the femtosecond accelerator device which was built at the Shanghai Institute of Applied Physics (SINAP), recently a modified far infrared Michelson interferometer has been developed to measur...