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Researchers develop new method of trapping multiple particles using fluidics
Researchers trapping multiple particles fluidics
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2016/4/13
Precise control of an individual particle or molecule is a difficult task. Controlling multiple particles simultaneously is an even more challenging endeavor. Researchers at the University of Illinois...
New Method to Measure the Fill Level of the Ball Mill: Part II—Analysis of the Vibration Signals
ball mill fill level vibration signal signal processing
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2011/8/5
The exact measurement of the fill level is the key and basic problem for automatic control and optimized operation of the coal pulverizing system. Because the ball mill pulverizing system is non-linea...
New Method to Measure the Fill Level of the Ball Mill: Part II—Analysis of the Vibration Signals
ball mill fill level vibration signal signal processing
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2011/8/4
The exact measurement of the fill level is the key and basic problem for automatic control and optimized operation of the coal pulverizing system. Because the ball mill pulverizing system is non-linea...
New Method to Measure the Fill Level of the Ball Mill I—Theoretical Analysis and DEM Simulation
ball mill fill level discrete element method (DEM) simulation
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2011/8/3
Up to now, the accurate measurement of the fill level in the ball mill hasn’t been resolved because of the interplay of many variable factors, which led the mill to be operated under the uneconomical ...
New Method for Patterning Semiconductor Oxides Suited for Nonplanar Surfaces(图)
Semiconductor Oxides Nonplanar Surfaces ITO
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2009/6/23
The novel technique uses a room temperature stamping method to transfer patterned, transparent semiconductor, indium tin oxide (ITO) onto an arbitrarily shaped surface – in this case a hemispherical s...