搜索结果: 1-1 共查到“光电检测技术 system.”相关记录1条 . 查询时间(0.281 秒)
Development of Duallight Path Monitoring System of Optical Thinfilm Thickness
optical engineering monitoring thinfilm thickness duallight path duallockphase circuit
font style='font-size:12px;'>
2008/6/30
The accurate monitoring of optical thinfilm thickness is a key technique for depositing optical thinfilm. For existing coating equipments, which are low precision and automation level on monitoring ...