搜索结果: 1-15 共查到“电子科学与技术 characterization”相关记录21条 . 查询时间(0.207 秒)
Aircraft ground station communications test environment characterization
Aircraft communications ground test ground to air communications the transmission path
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2014/12/31
This project report presents the concept, rationale, and results for the environment characterization pertaining to an aircraft communications ground test. The overall objective of this effort was to ...
On Detection, Analysis and Characterization of Transient and Parametric Failures in Nano-scale CMOS VLSI
Automatic Test Pattern Generation Crosstalk Design-for-Testability Integrated Circuit Intermittent Failure Soft Error
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2014/11/7
As we move deep into nanometer regime of CMOS VLSI (45nm node and below), the device noise margin gets sharply eroded because of continuous lowering of device threshold voltage together with ever incr...
Experimantal characterization and equivalent circuit extraction of nanowires for signal integrity applications
Experimantal characterization equivalent circuit extraction signal integrity applications
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2010/1/11
This paper illustrates the design steps of a printed circuit board used as test vehicles for the measurement of the electrical properties of carbon nanotube's deposit. The board has been built and use...
Variance and kurtosis-based characterization of resonances in stochastic transmission lines: local versus global random geometries
Variance and kurtosis-based characterization stochastic transmission lines global random geometries
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2010/1/11
A stochastic method is proposed to characterize electromagnetic couplings involving geometrically perturbed transmission lines. A combined exploitation of suitably defined statistical tools is present...
Characterization of p-type wide band gap transparent oxide for heterojunction devices
Applied sciences Pure sciences Transparent oxide films Wide band gap semiconductors Transparent oxide Heterojunction devices
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2014/11/7
Transparent p-type CuCr1-x Mgx O2 wide band gap oxide semiconductor thin films were deposited over quartz substrates by chemical spray pyrolysis technique using metalloorganic precursors. A mechanism ...
Spectroscopic Characterization of Electrodeposited Poly(o-toluidine) Thin Films and Electrical Properties of ITO/Poly(o-toluidine)/Aluminum Schottky Diodes
Spectroscopic Characterization Electrodeposited Poly(o-toluidine) Thin Films ITO/Poly(o-toluidine)/Aluminum Schottky Diodes
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2010/12/6
Poly(o-toluidine) (POT) thin films were synthesized by electrochemical polymerization under cyclic voltammetric conditions from o-toluidine monomer in an aqueous solution of HCl as a supporting electr...
Growth and Characterization of Crack-free AlGaN on AlN Interlayer
Crack-free AlGaN AlN Interlayer
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2010/7/15
The AlGaN samples have been grown on AlN interlayer (IL) by metalorganic vapor phase epitaxy (MOVPE). The effects of AlN IL on improvement of crystalline quality of AlGaN and Al incorporation efficien...
Synthesis and Characterization of Novel Organo-Inorganic Hybrid Material of Poly(3,4-Ethylene Dioxythiophene) and Phosphomolybdate Anion
3,4-Ethylene Dioxythiophene Phosphomolybdic acid Organo-inorganic hybrid material
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2010/12/7
The organo-inorganic hybrid material, consisting of Poly(3,4-Ethylene Dioxythiophene) (PEDOT) doped with phosphomolybdate cluster anions [PMo12O40]3− , has been synthesized by direct in situ oxi...
Preparation, Characterization and Electrochemical Lithium Insertion Into the New Organic–Inorganic Poly(3,4-Ethylene Dioxythiophene)/V2O5 Hybrid
Poly(3,4-ethylene dioxythiophene) Vanadium oxide Organo–inorganic hybrid
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2010/12/7
Poly(3,4-ethylene dioxythiophene) (PEDOT) has been inserted between the layers of crystalline V2O5 via the in situ polymerization of EDOT within the framework of the oxyde. The insertion increases the...
Junction Parameter Extraction for Electronic Device Characterization
Junction Parameter Extraction Electronic Device Characterization
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2010/12/7
A new method for the extraction of junction parameters from a description of the current–voltage characteristic is developed. A simulation is performed and a high accuracy is obtained for the determin...
Non-Linear Characterization of Memoryless SSP Amplifiers
Amplifier non-linear characterization and memory
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2010/12/7
This paper describes a testbed, which is able to generate all of the standard test signals used for characterising nonlinear amplifiers. The testbed is shown to be sufficiently linear to avoid any pos...
Material Characterization of High Dielectric Constant Polymer–Ceramic Composite for Embedded Capacitor to RF Application
Embedded capacitor Integral passives Polymer–ceramic nano-composite Breakdown voltage Leakage current High dielectric constant RF frequency
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2010/12/7
Embedded capacitor technology can improve electrical performance and reduce assembly cost compared with traditional discrete capacitor technology. Polymer–ceramic composites have been of great interes...
Characterization of Defect Traps in SiO2 Thin Films
Gate oxide MOS capacitor C-V characteristics Hysteresis Slow-state traps
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2010/12/8
In order to understand the degradation of the electrical operations of metal-oxide-semiconductor (MOS) devices, this work is concerned by the defects generation processes in the non-stoichiometric SiO...
Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors
MOS Transistor Surface roughness Effective mobility Series resistance
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2010/12/8
The aim of this work is therefore to propose an original method especially conceived for the extraction of the series resistance Rsd. Using the approach of the Surface Roughness Scattering which enabl...
Diode Physical Parameters for HEXFETs Characterization of Dose Effect
Dose effects HEXFET diode parameters
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2010/12/9
Modeling techniques of P-N junctions have been applied for studying the physical parameters in metal-oxide semiconductor field-effect transistor structures. A parameter extraction method provides a pr...