搜索结果: 1-5 共查到“半导体技术 characterization”相关记录5条 . 查询时间(0.24 秒)
On Detection, Analysis and Characterization of Transient and Parametric Failures in Nano-scale CMOS VLSI
Automatic Test Pattern Generation Crosstalk Design-for-Testability Integrated Circuit Intermittent Failure Soft Error
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2014/11/7
As we move deep into nanometer regime of CMOS VLSI (45nm node and below), the device noise margin gets sharply eroded because of continuous lowering of device threshold voltage together with ever incr...
Characterization of p-type wide band gap transparent oxide for heterojunction devices
Applied sciences Pure sciences Transparent oxide films Wide band gap semiconductors Transparent oxide Heterojunction devices
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2014/11/7
Transparent p-type CuCr1-x Mgx O2 wide band gap oxide semiconductor thin films were deposited over quartz substrates by chemical spray pyrolysis technique using metalloorganic precursors. A mechanism ...
Characterization of Defect Traps in SiO2 Thin Films
Gate oxide MOS capacitor C-V characteristics Hysteresis Slow-state traps
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2010/12/8
In order to understand the degradation of the electrical operations of metal-oxide-semiconductor (MOS) devices, this work is concerned by the defects generation processes in the non-stoichiometric SiO...
Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors
MOS Transistor Surface roughness Effective mobility Series resistance
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2010/12/8
The aim of this work is therefore to propose an original method especially conceived for the extraction of the series resistance Rsd. Using the approach of the Surface Roughness Scattering which enabl...
Diode Physical Parameters for HEXFETs Characterization of Dose Effect
Dose effects HEXFET diode parameters
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2010/12/9
Modeling techniques of P-N junctions have been applied for studying the physical parameters in metal-oxide semiconductor field-effect transistor structures. A parameter extraction method provides a pr...