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Thickness dependence of Co anisotropy in TbFe/Co exchange coupled bilayers
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2011/11/25
The orientation of element-specific moments was determined by using x-ray magnetic circular dichroism spectroscopy to explore exchange anisotropy of TbFe/Co bilayers. Perpendicular anisotropy of 15 ?C...
Determination of optical constants and thickness of amorphous GaP thin film
pulsed dc sputtering gallium phosphide film optical constants optical band gap
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2011/5/5
Gallium phosphide (GaP) thin film was prepared by an asymmetric bipolar pulsed-dc magnetron
sputtering technique onto glass substrate at room temperature in an Ar atmosphere. A compacted
GaP powder ...
Development of Duallight Path Monitoring System of Optical Thinfilm Thickness
optical engineering monitoring thinfilm thickness duallight path duallockphase circuit
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2008/6/30
The accurate monitoring of optical thinfilm thickness is a key technique for depositing optical thinfilm. For existing coating equipments, which are low precision and automation level on monitoring ...
Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method
ellipsometry passivation CdTe films
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2011/5/6
Ellipsometric detective method of refractive index, absorptive index and thickness of the film deposited on the substrate with some optical parameters has been developed. This method is applied for op...